Comparison of three methods for ellipsometry characterization of thin absorbing films
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DOI: 10.1016/j.tsf.2017.06.060
Abstract: Abstract Ellipsometry is a surface and film analytical technique which takes advantage of the fact that light reflecting from a surface undergoes a change in polarization state depending upon the geometric structure and materials of… read more here.
Keywords: three methods; comparison three; characterization thin; films comparison ... See more keywords