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Published in 2018 at "Journal of Alloys and Compounds"
DOI: 10.1016/j.jallcom.2018.05.269
Abstract: Abstract Surface quality is a key issue in semiconductor structures for device applications. Typical surface defects are blisters. Here we investigate on the relationship between the activation energy of blistering and the composition x in…
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Keywords:
law;
activation energy;
energy;
composition ... See more keywords
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Published in 2018 at "Surface and Coatings Technology"
DOI: 10.1016/j.surfcoat.2018.01.085
Abstract: Abstract As compared to the conventional smart-cut technology based on single H ion implantation, sequential implantation of H and He ions has been demonstrated to be effective in reducing the implantation fluence and the thermal…
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Keywords:
energy;
blistering characteristics;
sequential implantation;
ion energy ... See more keywords