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Published in 2021 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2021.114128
Abstract: Abstract The impact of heavy ion energy and species on single-event upsets (SEU) sensitivity in state-of-the-art NAND Flash memories is investigated in this paper. Experimental results indicate that the heavy ion with the same linear-energy-transfer…
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Keywords:
impact heavy;
heavy ion;
ion energy;
ion ... See more keywords