Enhanced Environmental Design for a New Integrated Hyper-Modal Microscope
Sign Up to like & getrecommendations! Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618001113
Abstract: Though the resolution of electron microscopy has increased to a sub-Angstrom level, even a small environmental perturbation will cause loss of resolution. Coupled to low accelerating voltage operation for high resolution EELS with possible monochromated… read more here.
Keywords: microscope; microscopy; enhanced environmental; environmental design ... See more keywords