Enhanced Interferometric Imaging by Rotating Coherent Scattering Microscopy
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DOI: 10.1021/acsphotonics.5c00123
Abstract: Label-free microscopy on the nanoscale requires high-sensitivity imaging. The challenge of visualizing very small objects, such as nanoparticles, arises from their weak interaction with light. As a result, a combination of high signal-to-noise ratio imaging… read more here.
Keywords: microscopy; enhanced interferometric; interferometric imaging; coherent scattering ... See more keywords