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Published in 2018 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2018.07.018
Abstract: Abstract Capacitance-voltage characterization of epitaxial n-type (100)Ge and (110)Ge metal-oxide-semiconductor capacitors (MOS Cs) was performed using two work function Al and Pt gate metals to evaluate the orientation effect on flat-band voltage (VFB) shift, Fermi…
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Keywords:
metal;
100 110;
work function;
epitaxial 100 ... See more keywords