High quality 4H-SiC homo-epitaxial wafer using the optimal C/Si ratio
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2019.125302
Abstract: Abstract Epitaxial growth of 4H-SiC on 4° off-axis substrates has been performed under different C/Si ratio in order to improve the quality level of epitaxial layer. 4H-SiC homoepitaxial layer is grown in horizontal warm-wall planetary… read more here.
Keywords: epitaxial layer; layer; high quality; ratio ... See more keywords
Characterization and analysis of electrical crosstalk in a linear array of CMOS image sensors.
Sign Up to like & getrecommendations! Published in 2022 at "Applied optics"
DOI: 10.1364/ao.474633
Abstract: In this paper, the influences of the depth and width of the oxide trench isolation between pixels, pixel epitaxial layer thickness for different impurity doping concentrations, and light exposure time on electrical crosstalk are characterized… read more here.
Keywords: cmos image; electrical crosstalk; epitaxial layer; crosstalk ... See more keywords
Epitaxial Growth and Characterization of 4H-SiC for Neutron Detection Applications
Sign Up to like & getrecommendations! Published in 2021 at "Materials"
DOI: 10.3390/ma14040976
Abstract: The purpose of this work is to study the 4H-SiC epitaxial layer properties for the fabrication of a device for neutron detection as an alternative material to diamond detectors used in this field. We have… read more here.
Keywords: epitaxial layer; carrier lifetime; neutron detection; spectroscopy ... See more keywords
Quantitative Analysis of Piezoresistive Characteristic Based on a P-type 4H-SiC Epitaxial Layer
Sign Up to like & getrecommendations! Published in 2019 at "Micromachines"
DOI: 10.3390/mi10100629
Abstract: In this work, the piezoresistive properties of heavily doped p-type 4H-SiC at room temperature were investigated innovatively. It was verified by a field emission scanning electron microscope (FESEM), X-ray diffraction (XRD), and laser Raman spectroscopy… read more here.
Keywords: epitaxial layer; sic piezoresistors; cantilever beam; type ... See more keywords