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Published in 2019 at "Physical Review Applied"
DOI: 10.1103/physrevapplied.12.054001
Abstract: We analyze the evolution of the normal and superconducting electronic properties in epitaxial TiN films, characterized by high Ioffe-Regel parameter values, as a function of the film thickness. As the film thickness decreases, we observe…
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Keywords:
surface magnetic;
epitaxial tin;
tin;
tin films ... See more keywords