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Published in 2017 at "IEEE Transactions on Electromagnetic Compatibility"
DOI: 10.1109/temc.2016.2638758
Abstract: An efficient emission model for radiation problems in integrated circuits (ICs) is required at the early phase of industrial design. Traditional source-reconstruction methods rely exclusively on near-field scanning and lack the flexibility needed to handle…
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Keywords:
integrated circuits;
source;
source reconstruction;
model ... See more keywords