Soft-Error-Immune Read-Stability-Improved SRAM for Multi-Node Upset Tolerance in Space Applications
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DOI: 10.1109/tcsi.2021.3085516
Abstract: With aggressive scaling of transistor size and supply voltage, the critical charge of the sensitive nodes is reducing rapidly. As a result, when these deep submicron devices are used in memory cells in the space… read more here.
Keywords: error immune; immune read; read stability; soft error ... See more keywords