Tiny Phase-Error Monitor for Fault and Soft-Error-Tolerant DLL to Support Graceful Degradation and Module-Level Testing
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3102893
Abstract: In an IC used for safety-critical applications, the Fault and soft-error tolerance (or FET) is often desirable. In this work, we consider a graceful degradation scheme, as the second line of defense, for a FET… read more here.
Keywords: dll; error; error monitor; phase error ... See more keywords