Full-Field High-Strain Gradient Evaluation from Wrapped ESPI Data Using Phasors
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DOI: 10.1007/s11340-017-0261-7
Abstract: Electronic Speckle Pattern Interferometry (ESPI) is a sensitive optical method commonly used for making full-field measurements of surface displacements. It would be very desirable to be able to extend the technique also to determine surface… read more here.
Keywords: high strain; full field; field high; espi data ... See more keywords