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Published in 2020 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2020.105265
Abstract: Abstract In this study, an etch-stop process was developed using inductively coupled plasma reactive-ion etching for precisely controlling the vertical cavity length of GaN-based devices, such as vertical-cavity surface-emitting lasers (VCSELs) and VCSEL 2D arrays.…
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Keywords:
etch stop;
cavity;
stop process;
vertical cavity ... See more keywords
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Published in 2017 at "Journal of Vacuum Science and Technology"
DOI: 10.1116/1.4974920
Abstract: In a companion article, the etch characteristics of materials within the Si-C-O-N-H system were surveyed using two common fluorinated plasma etches used to etch SiO2 interlayer dielectrics and SiN:H etch stop layers (CHF3 and CF4/O2,…
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Keywords:
high dielectrics;
etch stop;
optical lithography;
etch ... See more keywords
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2
Published in 2022 at "Materials"
DOI: 10.3390/ma15103503
Abstract: In this study, we investigated enhance mode (E-mode) p-GaN/AlGaN/GaN high-electron-mobility transistors (HEMTs) with an Al0.5GaN etch-stop layer. Compared with an AlN etch-stop layer, the Al0.5GaN etch-stop layer not only reduced lattice defects but engendered improved…
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Keywords:
al0 5gan;
layer;
stop layer;
etch stop ... See more keywords