Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications
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DOI: 10.1088/1748-0221/19/02/c02012
Abstract: The utilization of a radiation-hard microprocessor or a System-on-Chip (SoC) design methodology significantly benefits the future design of ASICs for HEP experiments. To evaluate the fault tolerance of a radiation-hard design, it is important to… read more here.
Keywords: risc; fault tolerance; evaluation study; microprocessor ... See more keywords