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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113443
Abstract: Abstract Experiments on total ionizing dose (TID) by cobalt-60 and single event effects (SEE) by pulsed laser and heavy ions were conducted on a 4 Mb commercial ReRAM from Fujitsu. The bit cell features two-transistor-two-resistor (2T2R)…
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Keywords:
total ionization;
ionization dose;
reram;
event effects ... See more keywords
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Published in 2025 at "Applied Physics Letters"
DOI: 10.1063/5.0283627
Abstract: This work presents the investigation of the single-event effects in β-Ga2O3 Schottky barrier diodes (SBDs) under heavy-ion irradiation with a reverse bias voltage of 100 V. The research focuses on the performance degradation and underlying mechanisms…
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Keywords:
single event;
schottky barrier;
ga2o3 schottky;
irradiation ... See more keywords
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Published in 2025 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2025.3550111
Abstract: The single-event effects (SEEs) of AlGaN/GaN HEMT devices under off-state, semi-on-state, and on-state are systematically investigated from experiments and TCAD simulations. Experimental results show that heavy ion radiation causes the most serious damage to the…
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Keywords:
single event;
algan gan;
event effects;
effects algan ... See more keywords
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Published in 2017 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2016.2632440
Abstract: New mechanisms of radiation sensitivity, such as low-energy proton SEU, potentially hinder the ability to define part-level failure rates and perform worst-case analysis. Ground-based radiation testing demonstrates sensitivity and is useful for understanding mechanisms, but…
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Keywords:
sourced monitoring;
crowd sourced;
cubesats crowd;
monitoring single ... See more keywords
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Published in 2021 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2020.3033188
Abstract: This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic.…
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Keywords:
single event;
zynq 7000;
event effects;
programmable logic ... See more keywords
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Published in 2024 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2023.3337288
Abstract: This article aims to provide a survey of modeling and simulation of single-event effects (SEEs) in digital electronics at device, circuit, and system levels. It primarily focuses on the specific multiscale, multiphysics, multidomain nature of…
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Keywords:
single event;
modeling simulation;
simulation single;
simulation ... See more keywords
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Published in 2024 at "Micromachines"
DOI: 10.3390/mi15040527
Abstract: The single-event effects (SEEs) of frequency divider circuits and the radiation tolerance of the hardened circuit are studied in this paper. Based on the experimental results of SEEs in InP HBTs, a transient current model…
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Keywords:
single event;
divider circuits;
divider;
event effects ... See more keywords