Total ionization dose and single event effects of a commercial stand-alone 4 Mb resistive random access memory (ReRAM)
Sign Up to like & getrecommendations! Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113443
Abstract: Abstract Experiments on total ionizing dose (TID) by cobalt-60 and single event effects (SEE) by pulsed laser and heavy ions were conducted on a 4 Mb commercial ReRAM from Fujitsu. The bit cell features two-transistor-two-resistor (2T2R)… read more here.
Keywords: total ionization; ionization dose; reram; event effects ... See more keywords
CubeSats and Crowd-Sourced Monitoring for Single Event Effects Hardness Assurance
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2016.2632440
Abstract: New mechanisms of radiation sensitivity, such as low-energy proton SEU, potentially hinder the ability to define part-level failure rates and perform worst-case analysis. Ground-based radiation testing demonstrates sensitivity and is useful for understanding mechanisms, but… read more here.
Keywords: sourced monitoring; crowd sourced; cubesats crowd; monitoring single ... See more keywords
Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions
Sign Up to like & getrecommendations! Published in 2021 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2020.3033188
Abstract: This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic.… read more here.
Keywords: single event; zynq 7000; event effects; programmable logic ... See more keywords