Mechanisms of Electron-Induced Single-Event Latchup
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DOI: 10.1109/tns.2018.2884537
Abstract: In this paper, possible mechanisms by which electrons can induce single-event latchups in electronics are discussed. The energy deposition and the nuclear fragments created by electrons in silicon are analyzed in this context. The cross… read more here.
Keywords: mechanisms electron; single event; event latchup; electron induced ... See more keywords
Compact Modeling of Single-Event Latchup of Integrated CMOS Circuit
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2019.2920629
Abstract: This paper presents a compact model of latchup considering design and process dependence. The new approach is more realistic and inspirited from the classical model. This model was used to confirm the single-event latchup (SEL)… read more here.
Keywords: single event; event latchup; compact modeling; latchup ... See more keywords