Angular Effects on Single-Event Mechanisms in Bulk FinFET Technologies
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DOI: 10.1109/tns.2017.2775234
Abstract: Angular single-event (SE) mechanisms and experimental upset data for 14-/16-nm bulk fin field-effect transistor (FinFET) technologies are presented and analyzed. The discrete structure of FinFETs introduces unique geometrical and orientation dependences for angular SE mechanisms… read more here.
Keywords: event mechanisms; finfet technologies; angular effects; effects single ... See more keywords