Measurement-Based Validation of Integrated Circuit Transient Electromagnetic Event Sensors
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DOI: 10.1109/temc.2020.3006166
Abstract: Determining the components or coupling paths responsible for soft failures during transient testing is challenging because the components are hidden within the product and because measuring internal voltages or currents during a transient test may… read more here.
Keywords: event sensors; voltage; electromagnetic event; integrated circuit ... See more keywords