LAUSR

Extended Transparent-Scan

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0 Published in 2019 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2019.2916497

Abstract: Transparent-scan is an approach to test compaction where scan shift cycles and functional capture cycles are interleaved in arbitrary ways as needed for detecting target faults. This is achieved by viewing the scan enable input… read more here.

Keywords: extended transparent; input; test compaction; transparent scan ... See more keywords