Extrinsic contributions to the dielectric and pyroelectric properties of Pb0.99[(Zr0.52Ti0.48)0.98Nb0.02]O3 thin films on Si and Ni substrates
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DOI: 10.1063/5.0014405
Abstract: The character of extrinsic contributions to the dielectric and pyroelectric properties of Pb0.99[(Zr0.52Ti0.48)0.98Nb0.02]O3 (PZT) films on Ni foil and Si wafers was explored using Rayleigh analysis, third harmonic phase angle, and Preisach analysis from 15 K… read more here.
Keywords: properties pb0; dielectric pyroelectric; extrinsic contributions; pb0 zr0 ... See more keywords