How to distinguish between opposite faces of an a‐plane sapphire wafer
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DOI: 10.1107/s1600576718001383
Abstract: A method to distinguish between two symmetrically equivalent opposite ð1120Þ and ð1120Þ faces of an a-plane sapphire wafer is described. It is shown that use of conventional X-ray diffraction analysis makes it possible to determine… read more here.
Keywords: distinguish opposite; sapphire; sapphire wafer; faces plane ... See more keywords