Articles with "fail open" as a keyword



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Circuit-type modelling of SiC power Mosfet in short-circuit operation including selective fail-to-open and fail-to-short modes competition

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Published in 2019 at "Microelectronics Reliability"

DOI: 10.1016/j.microrel.2019.113501

Abstract: Abstract SiC Mosfet has very unique properties in extreme operation such as a well-known fail-to-short failure mode but in competition with a lesser known fail-to-open failure mode. These two modes are generally studied and modelled… read more here.

Keywords: fail short; fail; mosfet; fail open ... See more keywords