High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis
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DOI: 10.1109/tvlsi.2016.2601606
Abstract: The failure rate of static RAM (SRAM) cells is restricted to be extremely low to ensure sufficient high yield for the entire chip. In addition, multiple performances of interest and influences from peripherals make SRAM… read more here.
Keywords: multiple failure; high dimensional; failure region; dimensional multiple ... See more keywords