A Two-Stage Algorithm for Identifying Software Failure Regions
Sign Up to like & getrecommendations! Published in 2025 at "IEEE Transactions on Reliability"
DOI: 10.1109/tr.2024.3441319
Abstract: Software developers can only obtain a very small amount of information from the individual failure-causing inputs, which makes debugging difficult. Therefore, it is necessary to explore additional failure-causing inputs (failure regions) using the known failure-causing… read more here.
Keywords: stage; two stage; failure causing; failure regions ... See more keywords
High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2016.2601606
Abstract: The failure rate of static RAM (SRAM) cells is restricted to be extremely low to ensure sufficient high yield for the entire chip. In addition, multiple performances of interest and influences from peripherals make SRAM… read more here.
Keywords: multiple failure; high dimensional; failure region; dimensional multiple ... See more keywords