Using a fast dual-wavelength imaging ellipsometric system to measure the flow thickness profile of an oil thin film
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DOI: 10.1016/j.apsusc.2017.01.100
Abstract: Abstract Dual-wavelength light sources with stroboscopic illumination technique were applied in a process of photoelastic modulated ellipsometry to retrieve two-dimensional ellipsometric parameters of thin films on a silicon substrate. Two laser diodes were alternately switched… read more here.
Keywords: ellipsometric system; dual wavelength; fast dual; using fast ... See more keywords