Fast Localization of Small Inhomogeneities from Far-Field Pattern Data in the Limited-Aperture Inverse Scattering Problem
Sign Up to like & getrecommendations! Published in 2021 at "Mathematics"
DOI: 10.3390/math9172087
Abstract: In this study, we consider a sampling-type algorithm for the fast localization of small electromagnetic inhomogeneities from measured far-field pattern data in the limited-aperture inverse scattering problem. For this purpose, we designed an indicator function… read more here.
Keywords: localization small; far field; field pattern; pattern data ... See more keywords