Preponing Fault Detections for Test Compaction Under Transparent Scan
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DOI: 10.1109/tvlsi.2022.3189804
Abstract: A test compaction procedure under transparent scan can compact a scan-based test set that contains a minimum number of tests. The additional test compaction can be important in applications that require highly compacted test sets.… read more here.
Keywords: test compaction; compaction; fault detections; transparent scan ... See more keywords