A new algorithm for the fast and stable identification of FAY coefficients and its application as a universal platform for yield surface modeling
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DOI: 10.1016/j.ijsolstr.2020.10.007
Abstract: Abstract A new approach is proposed for enabling the exchange and testing of arbitrary yield surface models, solely based on a set of Fourier coefficients. This effectively reduces the implementation efforts to a single generic… read more here.
Keywords: fay coefficients; yield surface; new algorithm; yield ... See more keywords