Characterization and modeling of 28-nm FDSOI CMOS technology down to cryogenic temperatures
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DOI: 10.1016/j.sse.2019.03.033
Abstract: Abstract This paper presents an extensive characterization and modeling of a commercial 28-nm FDSOI CMOS process operating down to cryogenic temperatures. The important cryogenic phenomena influencing this technology are discussed. The low-temperature transfer characteristics including… read more here.
Keywords: temperature; fdsoi cmos; cryogenic temperatures; characterization modeling ... See more keywords