Articles with "fet reliability" as a keyword



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Guidelines for Ferroelectric FET Reliability Optimization: Charge Matching

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Published in 2020 at "IEEE Electron Device Letters"

DOI: 10.1109/led.2020.3011037

Abstract: An optimization principle for ferroelectric FET (FeFET), centered around charge matching between the ferroelectric and its underlying semiconductor, is theoretically investigated. This letter shows that, by properly reducing the ferroelectric polarization charge and its background… read more here.

Keywords: guidelines ferroelectric; optimization; ferroelectric fet; charge matching ... See more keywords