High-performance CuS/n-Si heterojunction photodetectors prepared by e-beam evaporation of Cu films as precursor layers
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DOI: 10.1016/j.jallcom.2021.161121
Abstract: Abstract Transition metal dichalcogenides (TMDCs) are considered to be the most promising next-generation materials for electronics and optoelectronics due to their excellent properties. In this work, well-performing CuS films were prepared by e-beam evaporation of… read more here.
Keywords: precursor layers; evaporation films; cus; films precursor ... See more keywords