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Published in 2017 at "Circuits, Systems, and Signal Processing"
DOI: 10.1007/s00034-017-0638-y
Abstract: As the VLSI technology is heading toward deep subnanometer range, the NBTI effect has emerged as a major reliability issue for the state-of-the-art CMOS as well as FinFET-based circuits. NBTI causes an incremental deviation in…
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Keywords:
based low;
register file;
reliable finfet;
low power ... See more keywords
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Published in 2017 at "Journal of Computational Electronics"
DOI: 10.1007/s10825-016-0950-y
Abstract: Scaling of metal–oxide–semiconductor field-effect transistors (MOSFETs) to below a few tens of nanometer has failed to make significant improvements. FinFETs were introduced to replace MOS devices in circuits, offering good performance improvement in the nanoscale…
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Keywords:
junctionless finfet;
based sram;
finfet junctionless;
finfet ... See more keywords
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Published in 2019 at "AEU - International Journal of Electronics and Communications"
DOI: 10.1016/j.aeue.2019.06.012
Abstract: Abstract FinFET based Improved Pass-transistor Adiabatic Logic (IPAL) powered by four-phase power-clock is presented. Capable of operating across MHz to GHz frequency range, it consists of differential cascode structure along with discharge devices for increased…
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Keywords:
energy efficiency;
finfet based;
power;
architecture ... See more keywords