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Published in 2022 at "Frontiers in Plant Science"
DOI: 10.3389/fpls.2022.1047899
Abstract: Flag leaf size is a crucial trait influencing plant architecture and yield potential in wheat. A recombinant inbred line (RIL) population derived from the cross of W7268 and Chuanyu 12 was employed to identify quantitative…
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Keywords:
leaf size;
flag leaf;
leaf;
fla cib ... See more keywords