Degradation Mechanisms in Metallized Barrier Films for Vacuum Insulation Panels Subjected to Flanging-Induced Stress
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DOI: 10.3390/nano15161231
Abstract: The long-term reliability of vacuum insulation panels (VIPs) is constrained by the barrier film degradation caused by micro-cracks during the flanging process. However, the correlation mechanism between process parameters and microleakage remains unclear. This study… read more here.
Keywords: degradation; subjected flanging; flanging cycles; insulation panels ... See more keywords