Fast neutron irradiation tests of flash memories used in space environment at the ISIS spallation neutron source
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DOI: 10.1063/1.5017945
Abstract: This paper presents a neutron accelerated study of soft errors in advanced electronic devices used in space missions, i.e. Flash memories performed at the ChipIr and VESUVIO beam lines at the ISIS spallation neutron source.… read more here.
Keywords: neutron; space; flash memories; isis spallation ... See more keywords
Adaptive Artificial Neural Network-Coupled LDPC ECC as Universal Solution for 3-D and 2-D, Charge-Trap and Floating-Gate NAND Flash Memories
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DOI: 10.1109/jssc.2018.2884949
Abstract: Adaptive artificial neural network (ANN)-coupled low-density parity-check (LDPC) error-correcting code (ECC) (ANN-LDPC ECC) is proposed to increase acceptable errors for various NAND flash memories. The proposed ANN-LDPC ECC can be the universal solutions for 3-D… read more here.
Keywords: ldpc; ann ldpc; charge trap; floating gate ... See more keywords