Compact modeling of GIDL-assisted erase in 3-D NAND Flash strings
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DOI: 10.1007/s10825-019-01328-0
Abstract: This paper presents a physics-based compact model able to describe the time dynamics of the erase operation in three-dimensional NAND Flash strings exploiting gate-induced drain leakage at the selector to increase the string potential. The… read more here.
Keywords: modeling gidl; flash strings; nand flash; compact modeling ... See more keywords