Surface analysis and depth profiling using time-of-flight elastic recoil detection analysis with argon sputtering
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DOI: 10.1038/s41598-018-28726-x
Abstract: The recent development of new advanced materials demands extensive effort in developing new analytical techniques that can provide insight into material composition at the nanoscale, particularly at surfaces and interfaces, which is important for both… read more here.
Keywords: flight elastic; depth; elastic recoil; analysis ... See more keywords