Cost Efficient Flip-Flop Designs With Multiple-Node Upset-Tolerance and Algorithm-Based Verifications
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DOI: 10.1109/tcad.2024.3426271
Abstract: This article presents radiation-hardened flip-flop (FF) designs capable of tolerating soft errors, e.g., single-node upsets (SNUs), double-node upsets (DNUs) and multiple-node upsets (MNUs). First, a 2-input FF and a 3-input FF are proposed as the… read more here.
Keywords: multiple node; tolerance; flip flop; flop designs ... See more keywords