Fluctuations of focused electron beam in a conventional SEM.
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DOI: 10.1016/j.ultramic.2019.05.008
Abstract: Noise diagnostics was performed on a tungsten hairpin cathode that was used in conventional scanning electron microscope (SEM) which operates in a high vacuum. The focused beam was firstly measured and its power spectrum obtained… read more here.
Keywords: fluctuations focused; noise; electron beam; focused electron ... See more keywords