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Published in 2022 at "Glia"
DOI: 10.1002/glia.24290
Abstract: Healthy myelin sheaths consist of multiple compacted membrane layers closely encasing the underlying axon. The ultrastructure of CNS myelin requires specialized structural myelin proteins, including the transmembrane‐tetraspan proteolipid protein (PLP) and the Ig‐CAM myelin‐associated glycoprotein…
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Keywords:
focused ion;
microscopy;
myelin outfoldings;
electron ... See more keywords
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Published in 2019 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2018.10.263
Abstract: Abstract We have studied the growth of metastable face-centered-cubic, non-magnetic Fe78Ni22 thin films on silicon substrates. These films undergo a magnetic (paramagnetic to ferromagnetic) and structural (fcc to bcc) phase transformation upon ion beam irradiation…
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Keywords:
thin films;
ion beam;
fe78ni22;
ion ... See more keywords
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Published in 2017 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2017.04.013
Abstract: Abstract We investigate monocrystalline InAs nanowires (NWs) which are grown catalyst assisted by molecular beam epitaxy (MBE) and create the catalyst by focused ion beam (FIB) implanted Au spots. With this combination of methods an…
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Keywords:
inas nanowires;
molecular beam;
focused ion;
beam epitaxy ... See more keywords
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Published in 2019 at "Journal of Magnetism and Magnetic Materials"
DOI: 10.1016/j.jmmm.2018.12.055
Abstract: Abstract Focused ion beam (FIB) irradiation was applied to an ultrathin Pt/Co/Pt film to create micrometer-sized, square-shaped regions with perpendicular orientation of magnetization embedded in an in-plane magnetized environment. The FIB parameters like ion fluence…
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Keywords:
focused ion;
magnetization;
ion;
ion beam ... See more keywords
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Published in 2021 at "Journal of structural biology"
DOI: 10.1016/j.jsb.2021.107743
Abstract: Cryo-electron tomography (cryo-ET) is an emerging technique to study the cellular architecture and the structure of proteins at high resolution in situ. Most biological specimens are too thick to be directly investigated and are therefore…
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Keywords:
milling;
ion beam;
cryo;
focused ion ... See more keywords
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Published in 2021 at "Materials Chemistry and Physics"
DOI: 10.1016/j.matchemphys.2021.125062
Abstract: Abstract A combination of X-ray computed tomography (CT) and focused ion beam - scanning electron microscopy (FIB-SEM) has been employed to investigate substrate and related surface defects in a niobium coated superconducting radio frequency (SRF)…
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Keywords:
focused ion;
surface;
copper;
ray computed ... See more keywords
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Published in 2017 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2017.03.003
Abstract: Abstract Focused ion beam implantation was used for the formation of Ga droplets which act as nucleation points for self-catalyzed, molecular beam epitaxy-grown nanowires on Si(111). In order to further optimize the growth, the substrate…
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Keywords:
beam implantation;
ion beam;
focused ion;
implantation ... See more keywords
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Published in 2019 at "Materialia"
DOI: 10.1016/j.mtla.2019.100294
Abstract: Abstract Focused ion beam (FIB) tomography was used to characterize three-dimensional (3D) internal microstructures of plutonium oxalate and oxide particles. Sequential two-dimensional (2D) sectioning and imaging using FIB and 3D image reconstruction were used to…
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Keywords:
focused ion;
oxide particles;
plutonium oxalate;
three dimensional ... See more keywords
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Published in 2022 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2022.113481
Abstract: At present, the focused ion beam method is an effective technique for nanoscale profiling of a solid surface and prototyping of micro- and nanoscale structures. The article reveals the results of experimental studies on improving…
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Keywords:
beam;
nanoscale structures;
ion beam;
focused ion ... See more keywords
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Published in 2017 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927617002185
Abstract: One of the most popular tools for TEM specimen preparation is gallium focused ion beam (FIB). It is well known that the FIB’s high-energy Ga ions can damage a specimen’s crystalline structure by introducing lattice…
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Keywords:
gallium;
focused ion;
fib;
preparation ... See more keywords
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Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619005051
Abstract: Focused Ion Beam (FIB) devices such as the Helium Ion Microscope (HIM) as well as FIB/SEMs have sparked great interest within the biological sciences in recent years. The HIM allows high resolution imaging of uncoated…
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Keywords:
focused ion;
biology;
microscope;
ion ... See more keywords