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Published in 2025 at "Advanced Engineering Materials"
DOI: 10.1002/adem.202500243
Abstract: Friction and wear are among the most crucial limiting factors for micro‐electro‐mechanical systems reliability. In this article, it introduces a novel approach to microtribological research by developing ultrastiff atomic force microscopy (AFM) probes capable of…
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Keywords:
atomic force;
tribology;
zrc coatings;
force microscopy ... See more keywords
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Published in 2022 at "Advanced Materials"
DOI: 10.1002/adma.202206237
Abstract: Piezoresponse force microscopy (PFM) is widely used for characterization and exploration of the nanoscale properties of ferroelectrics. However, quantification of the PFM signal is challenging due to the convolution of various extrinsic and intrinsic contributions.…
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Keywords:
quantification;
force microscopy;
microscopy;
piezoresponse force ... See more keywords
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Published in 2024 at "Advanced Materials"
DOI: 10.1002/adma.202407291
Abstract: Scanning probe microscopy (SPM) has enabled significant new insights into the nanoscale and microscale properties of solar cell materials and underlying working principles of photovoltaic and optoelectronic technology. Various SPM modes, including atomic force microscopy,…
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Keywords:
microscopy;
scanning probe;
halide perovskite;
force microscopy ... See more keywords
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Published in 2025 at "Advanced Materials Interfaces"
DOI: 10.1002/admi.202500137
Abstract: 2D materials garner significant research interest due to their unique properties. However, fabricating 2D material electronic devices requires arraying these materials, which often leads to issues like residual photoresist and the need for expensive equipment…
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Keywords:
anodic oxidation;
based local;
atomic force;
force microscopy ... See more keywords
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Published in 2022 at "Advanced Science"
DOI: 10.1002/advs.202201489
Abstract: In this work, 3D polymeric atomic force microscopy (AFM) tips, referred to as 3DTIPs, are manufactured with great flexibility in design and function using two‐photon polymerization. With the technology holding a great potential in developing…
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Keywords:
afm tips;
force microscopy;
microscopy;
generation ... See more keywords
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Published in 2018 at "Biotechnology journal"
DOI: 10.1002/biot.201700625
Abstract: Circulating tumor cell (CTC) which recently arisen as potential sources for monitoring and characterizing non-haematologic cancers and their metastatic derivatives. Immunomagnetic microbeads and magnetic nanoparticles (MNPs) have been extensively explored to isolate CTCs from blood…
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Keywords:
microscopy;
force microscopy;
surface marker;
breast cancer ... See more keywords
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Published in 2020 at "Microscopy Research and Technique"
DOI: 10.1002/jemt.23569
Abstract: The physical properties of electronic devices made by 2,6‐diphenyl anthracene (DPA) are influenced by the microtexture of DPA surfaces. This work focused on the experimental investigation of the 3‐D surface microtexture of DPA thin films…
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Keywords:
topography;
thin films;
microscopy;
force microscopy ... See more keywords
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Published in 2022 at "Microscopy Research and Technique"
DOI: 10.1002/jemt.24261
Abstract: Approximations of the geometry of indenting probes, particularly when using shallow indentations on soft materials, can lead to the erroneous reporting of mechanical data in atomic force microscopy (AFM). Scanning electron microscopy (SEM) identified a…
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Keywords:
force microscopy;
microscopy;
geometry;
shallow indentations ... See more keywords
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Published in 2025 at "Microscopy Research and Technique"
DOI: 10.1002/jemt.24832
Abstract: Colloidal forces are essential for maintaining the stability and functionality of colloidal systems, affecting various industrial, biological, and environmental processes. They play an important role in determining the behavior of particles in suspensions, including stability,…
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Keywords:
microscopy;
colloidal forces;
force;
atomic force ... See more keywords
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Published in 2021 at "Small"
DOI: 10.1002/smll.202102495
Abstract: Kelvin probe force microscopy (KPFM) is a popular technique for mapping the surface potential at the nanoscale through measurement of the Coulombic force between an atomic force microscopy (AFM) tip and sample. The lateral resolution…
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Keywords:
microscopy;
tapping mode;
force microscopy;
force ... See more keywords
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Published in 2021 at "Small"
DOI: 10.1002/smll.202102977
Abstract: Immense strides have been made in increasing the resolution of scanning probe microscopy. Noncontact atomic force microscopy (nc-AFM) now offers one the ability to characterize and visualize single molecules with subatomic resolution. Specifically, nc-AFM with…
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Keywords:
microscopy;
atomic fingerprinting;
force microscopy;
atomic force ... See more keywords