Articles with "force microscopy" as a keyword



Tribology of ZrC Coatings and Spherical Tips Acquired with Extraordinarily Stiff, Metal Atomic Force Microscopy Probes

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Published in 2025 at "Advanced Engineering Materials"

DOI: 10.1002/adem.202500243

Abstract: Friction and wear are among the most crucial limiting factors for micro‐electro‐mechanical systems reliability. In this article, it introduces a novel approach to microtribological research by developing ultrastiff atomic force microscopy (AFM) probes capable of… read more here.

Keywords: atomic force; tribology; zrc coatings; force microscopy ... See more keywords

Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy

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Published in 2022 at "Advanced Materials"

DOI: 10.1002/adma.202206237

Abstract: Piezoresponse force microscopy (PFM) is widely used for characterization and exploration of the nanoscale properties of ferroelectrics. However, quantification of the PFM signal is challenging due to the convolution of various extrinsic and intrinsic contributions.… read more here.

Keywords: quantification; force microscopy; microscopy; piezoresponse force ... See more keywords

Scanning Probe Microscopy of Halide Perovskite Solar Cells

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Published in 2024 at "Advanced Materials"

DOI: 10.1002/adma.202407291

Abstract: Scanning probe microscopy (SPM) has enabled significant new insights into the nanoscale and microscale properties of solar cell materials and underlying working principles of photovoltaic and optoelectronic technology. Various SPM modes, including atomic force microscopy,… read more here.

Keywords: microscopy; scanning probe; halide perovskite; force microscopy ... See more keywords

Recent Advances in Atomic Force Microscopy‐Based Local Anodic Oxidation Nanolithography of 2D Materials

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Published in 2025 at "Advanced Materials Interfaces"

DOI: 10.1002/admi.202500137

Abstract: 2D materials garner significant research interest due to their unique properties. However, fabricating 2D material electronic devices requires arraying these materials, which often leads to issues like residual photoresist and the need for expensive equipment… read more here.

Keywords: anodic oxidation; based local; atomic force; force microscopy ... See more keywords

3D Generation of Multipurpose Atomic Force Microscopy Tips (Adv. Sci. 27/2022)

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Published in 2022 at "Advanced Science"

DOI: 10.1002/advs.202201489

Abstract: In this work, 3D polymeric atomic force microscopy (AFM) tips, referred to as 3DTIPs, are manufactured with great flexibility in design and function using two‐photon polymerization. With the technology holding a great potential in developing… read more here.

Keywords: afm tips; force microscopy; microscopy; generation ... See more keywords

Subtyping of Magnetically Isolated Breast Cancer Cells Using Magnetic Force Microscopy.

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Published in 2018 at "Biotechnology journal"

DOI: 10.1002/biot.201700625

Abstract: Circulating tumor cell (CTC) which recently arisen as potential sources for monitoring and characterizing non-haematologic cancers and their metastatic derivatives. Immunomagnetic microbeads and magnetic nanoparticles (MNPs) have been extensively explored to isolate CTCs from blood… read more here.

Keywords: microscopy; force microscopy; surface marker; breast cancer ... See more keywords
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The evaluation of surface topography changes in nanoscaled 2,6‐diphenyl anthracene thin films by atomic force microscopy

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Published in 2020 at "Microscopy Research and Technique"

DOI: 10.1002/jemt.23569

Abstract: The physical properties of electronic devices made by 2,6‐diphenyl anthracene (DPA) are influenced by the microtexture of DPA surfaces. This work focused on the experimental investigation of the 3‐D surface microtexture of DPA thin films… read more here.

Keywords: topography; thin films; microscopy; force microscopy ... See more keywords

Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy

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Published in 2022 at "Microscopy Research and Technique"

DOI: 10.1002/jemt.24261

Abstract: Approximations of the geometry of indenting probes, particularly when using shallow indentations on soft materials, can lead to the erroneous reporting of mechanical data in atomic force microscopy (AFM). Scanning electron microscopy (SEM) identified a… read more here.

Keywords: force microscopy; microscopy; geometry; shallow indentations ... See more keywords

Measuring Colloidal Forces With Atomic Force Microscopy 1: Salt Influence on Hydrophobic and Hydrophilic Interactions

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Published in 2025 at "Microscopy Research and Technique"

DOI: 10.1002/jemt.24832

Abstract: Colloidal forces are essential for maintaining the stability and functionality of colloidal systems, affecting various industrial, biological, and environmental processes. They play an important role in determining the behavior of particles in suspensions, including stability,… read more here.

Keywords: microscopy; colloidal forces; force; atomic force ... See more keywords
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Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping.

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Published in 2021 at "Small"

DOI: 10.1002/smll.202102495

Abstract: Kelvin probe force microscopy (KPFM) is a popular technique for mapping the surface potential at the nanoscale through measurement of the Coulombic force between an atomic force microscopy (AFM) tip and sample. The lateral resolution… read more here.

Keywords: microscopy; tapping mode; force microscopy; force ... See more keywords

Atomic Fingerprinting of Heteroatoms Using Noncontact Atomic Force Microscopy.

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Published in 2021 at "Small"

DOI: 10.1002/smll.202102977

Abstract: Immense strides have been made in increasing the resolution of scanning probe microscopy. Noncontact atomic force microscopy (nc-AFM) now offers one the ability to characterize and visualize single molecules with subatomic resolution. Specifically, nc-AFM with… read more here.

Keywords: microscopy; atomic fingerprinting; force microscopy; atomic force ... See more keywords