Fourier optics of image formation in aberration-corrected LEEM.
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DOI: 10.1016/j.ultramic.2019.01.015
Abstract: We present the extended Fourier Optics (FO) approach for modeling image formation in aberration-corrected low energy electron microscopy (ac-LEEM). The FO formalism is also generalized for image simulations of one or two-dimensional objects in ac… read more here.
Keywords: formation aberration; image; fourier optics; optics ... See more keywords