Framework for TCAD augmented machine learning on multi- I – V characteristics using convolutional neural network and multiprocessing
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DOI: 10.1088/1674-4926/42/12/124101
Abstract: In a world where data is increasingly important for making breakthroughs, microelectronics is a field where data is sparse and hard to acquire. Only a few entities have the infrastructure that is required to automate… read more here.
Keywords: tcad augmented; machine learning; using convolutional; convolutional neural ... See more keywords