Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy
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DOI: 10.1016/j.optlaseng.2017.07.010
Abstract: Abstract In white light interference based atomic force microscopy (WLIAFM), the vertical displacement of the probe is obtained by zero-order fringe positioning on the probe cantilever, so the accuracy of zero-order fringe positioning will affect… read more here.
Keywords: order fringe; zero order; fringe positioning; microscopy ... See more keywords