Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Applied Crystallography"
DOI: 10.1107/s1600576717005581
Abstract: By simultaneously measuring changes in energy and reflection angle of Laue spots with respect to a reference position, it is possible to measure all lattice parameters of a unit cell and calculate the full strain/stress… read more here.
Keywords: full strain; energy; strain tensor; single shot ... See more keywords