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Published in 2020 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2019.104833
Abstract: Abstract This paper presents the lattice disorder-induced effect by oxygen ion implantation in GaN epitaxial layers. Oxygen ion implantation in GaN epitaxial layers is done with fluencies 5 × 1014 cm−2 and 5 × 1015 cm−2 at 120 keV energy on two different…
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Keywords:
implanted gan;
gan epitaxial;
epitaxial layers;
ion implanted ... See more keywords
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Published in 2018 at "Journal of Physical Chemistry C"
DOI: 10.1021/acs.jpcc.8b04410
Abstract: Polarity-controlled GaN epitaxial films with Ga- and N-polarity are intentionally obtained by controlling annealing processes of ScAlMgO4 substrates. It is proved by high-angle annular dark-field scanning transmission electron microscopy, in situ reflection high-energy electron diffraction,…
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Keywords:
microscopy;
epitaxial films;
polarity;
gan epitaxial ... See more keywords
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Published in 2025 at "APL Materials"
DOI: 10.1063/5.0250514
Abstract: Epitaxial combination of transition metal nitrides and group III-nitrides holds significant potential for novel device architectures, given their wide array of properties and similar lattice constants. However, the mixture of hexagonal and cubic crystals limits…
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Keywords:
nitrides cubic;
metal nitrides;
epitaxial integration;
gan epitaxial ... See more keywords
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Published in 2023 at "Nanotechnology"
DOI: 10.1088/1361-6528/acb4a0
Abstract: Second harmonic generation (SHG) intensity, Raman scattering stress, photoluminescence and reflected interference pattern are used to determine the distributions of threading dislocations (TDs) and horizontal dislocations (HDs) in the c-plane GaN epitaxial layers on 6…
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Keywords:
epitaxial layers;
second harmonic;
intensity;
gan epitaxial ... See more keywords
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Published in 2020 at "Semiconductors"
DOI: 10.1134/s1063782620140183
Abstract: Investigation of GaN epitaxial layers on silicon substrates is driven by high potential for fabrication of high efficiency and relatively low-cost electronic devises. Growth process of GaN layers on Si by molecular-beam epitaxy is complicated…
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Keywords:
spectroscopy;
molecular beam;
beam epitaxy;
epitaxial layers ... See more keywords
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Published in 2024 at "Micromachines"
DOI: 10.3390/mi15080954
Abstract: A series of characterization methods involving high-resolution X-ray diffraction (HR-XRD), electron channel contrast imaging (ECCI), cathodoluminescence microscopy (CL), and atomic force microscopy (AFM) were applied to calculate the dislocation density of GaN-on-Si epitaxial wafers, and…
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Keywords:
epitaxial wafers;
dislocation;
density gan;
density ... See more keywords
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Published in 2019 at "Applied Physics Express"
DOI: 10.7567/1882-0786/ab04f1
Abstract: Pyramidal inversion domains (PIDs) with (0001) bases several nanometers wide are commonly observed in highly Mg-doped GaN epitaxial layers. High-angle annular dark field scanning transmission electron microscopy clarified the PID boundary structure, concluding debate on…
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Keywords:
atomic resolution;
segregation;
layer;
pyramidal inversion ... See more keywords