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Published in 2020 at "Microwave and Optical Technology Letters"
DOI: 10.1002/mop.32404
Abstract: A new scalable small‐signal model for 0.1 μm AlGaN/GaN HEMT up to 110 GHz is presented in this paper. The taps between the gate/drain manifold and fingers on the device has been investigated and included in…
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Keywords:
gan hemt;
110 ghz;
small signal;
hemt 110 ... See more keywords
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Published in 2020 at "Silicon"
DOI: 10.1007/s12633-020-00503-4
Abstract: AlGaN/GaN-HEMT with Single to Multi-step gate field plate is proposed in this work. The proposed device enhanced Drain current, breakdown voltage and shift in threshold voltage. The performance of proposed device is analyzed and compared…
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Keywords:
step gate;
multi step;
step;
performance ... See more keywords
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Published in 2021 at "AEU - International Journal of Electronics and Communications"
DOI: 10.1016/j.aeue.2021.153774
Abstract: Abstract The dc and high frequency performances of Al composition Graded Channel AlGaN/GaN high electron mobility transistor on GaN substrate was investigated and compared with Conventional AlGaN/GaN HEMT. The high frequency characteristics were measured on…
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Keywords:
algan gan;
gan hemt;
drain current;
graded channel ... See more keywords
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Published in 2018 at "Applied Thermal Engineering"
DOI: 10.1016/j.applthermaleng.2018.05.072
Abstract: Abstract An experimental and numerical investigation of water-cooled serpentine rectangular minichannel heat sinks (MCHS) has been performed to assess their suitability for the thermal management of gallium nitride (GaN) high-electron-mobility transistors (HEMTs) devices. A Finite…
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Keywords:
minichannel heat;
heat sinks;
thermal management;
heat ... See more keywords
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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113412
Abstract: Abstract This paper describes the design of a power-cycling test bench to study the reliability of power-GaN-HEMT power switches. The aim of the presented paper is to study the measurable electrical consequences of internal degradation…
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Keywords:
degradation;
power;
power cycling;
degradation indicators ... See more keywords
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Published in 2021 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2021.105694
Abstract: Abstract This work presents the development of Fe ion implantation processes for the fabrication of thermally stable isolation of AlGaN/GaN high electron mobility transistors (HEMTs). Experiments, carried out by the triple Fe+ implantation into AlGaN/GaN…
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Keywords:
algan gan;
gan hemt;
isolation;
interplay damage ... See more keywords
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Published in 2017 at "Superlattices and Microstructures"
DOI: 10.1016/j.spmi.2017.08.002
Abstract: Abstract In this article, we present the DC and microwave characteristics of a novel 30 nm T-gate InAlN/AlN/GaN HEMT with AlGaN back-barrier. The device structure is simulated by using Synopsys Sentaurus TCAD Drift-Diffusion transport model at…
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Keywords:
gate;
power;
hemt;
hemt algan ... See more keywords
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Published in 2017 at "Superlattices and Microstructures"
DOI: 10.1016/j.spmi.2017.12.027
Abstract: Abstract In this paper, the drain current collapse in AlGaN/GaN High Electron Mobility Transistor (HEMT) with field plate engineering is investigated. A small signal equivalent circuit of AlGaN/GaN HEMT is developed and a new drain…
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Keywords:
current collapse;
algan gan;
gan hemt;
drain current ... See more keywords
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Published in 2019 at "International Journal of Microwave and Wireless Technologies"
DOI: 10.1017/s1759078719000059
Abstract: Abstract Guaranteeing charge conservation of empirically extracted Gallium Nitride (GaN) High-Electron-Mobility Transistor (HEMT) models is necessary to avoid simulation issues and artifacts in the prediction. However, dispersive effects, such as thermal and charge-trapping phenomena, may…
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Keywords:
non isodynamic;
gan hemt;
charge conservative;
multi bias ... See more keywords
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Published in 2021 at "Applied Physics Letters"
DOI: 10.1063/5.0050584
Abstract: Integration of nitrides with other material systems has recently become of interest due to the high performance of GaN-based high-electron mobility transistors. However, the elevated growth temperatures often used to grow high quality AlN pose…
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Keywords:
low temperature;
temperature;
aln gan;
gan hemt ... See more keywords
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Published in 2023 at "Journal of Physics D: Applied Physics"
DOI: 10.1088/1361-6463/acdadd
Abstract: This work proposes a semi-physical equivalent circuit model for GaN-based high electron mobility transistor (GaN HEMT), taking into account the non-ideal effects of both current source and resistance-capacitance components. The current source model is built…
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Keywords:
non ideal;
equivalent circuit;
circuit model;
gan hemt ... See more keywords