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Published in 2019 at "CrystEngComm"
DOI: 10.1039/c9ce00463g
Abstract: We have observed anisotropic mosaicity of an m-plane GaN homoepitaxial layer by X-ray diffraction topography imaging over a wafer and X-ray rocking curves measured at various wafer points.
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Keywords:
plane;
gan homoepitaxial;
plane gan;
anisotropic mosaicity ... See more keywords