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Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.07.195
Abstract: Abstract III-N surface polarization compensating charge referred here to as ‘surface donors’ (SD) was analyzed in Al 2 O 3 /AlGaN/GaN metal-oxide-semiconductor (MOS) heterojunctions using scaled oxide films grown by metal-organic chemical vapor deposition at…
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Keywords:
surface;
algan gan;
metal oxide;
chemical ... See more keywords
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Published in 2023 at "Micromachines"
DOI: 10.3390/mi14061183
Abstract: This paper reports on improved AlGaN/GaN metal oxide semiconductor high-electron mobility transistors (MOS-HEMTs). TiO2 is used to form the dielectric and passivation layers. The TiO2 film is characterized using X-ray photoemission spectroscopy (XPS), Raman spectroscopy,…
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Keywords:
metal oxide;
algan gan;
gan metal;
spectroscopy ... See more keywords