Hard-switching reliability studies of 1200 V vertical GaN PiN diodes
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DOI: 10.1557/mrc.2018.204
Abstract: We report on reliability testing of vertical GaN (v-GaN) devices under continuous switching conditions of 500, 750, and 1000 V. Using a modified double-pulse test circuit, we evaluate 1200 V-rated v-GaN PiN diodes fabricated by… read more here.
Keywords: gan pin; pin diodes; reliability; vertical gan ... See more keywords