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1
Published in 2020 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2020.145267
Abstract: Abstract Using the complexes of structural and spectroscopic diagnostic techniques, we investigated the influence of the layer of nanoporous silicon on the practical implementation and certain features of the epitaxial growth of GaN layers with…
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Keywords:
gan layer;
layer;
sic por;
silicon ... See more keywords
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Published in 2022 at "IEEE Access"
DOI: 10.1109/access.2021.3137908
Abstract: This paper proposes high sensitivity temperature sensors based on single port surface acoustic wave (SAW) devices with GHz resonance frequencies, developed on GaN/SiC and GaN/Sapphire, which permit wide range, accurate temperature determinations. In contrast with…
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Keywords:
sapphire;
gan sapphire;
gan sic;
surface acoustic ... See more keywords
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0
Published in 2017 at "IEEE Electron Device Letters"
DOI: 10.1109/led.2017.2714865
Abstract: Silicon carbide (SiC) power devices have been commercialized up to 1.7 kV with operating temperatures up to 573 K. The temperature limitations of SiC devices are generally derived from limitations in packaging and a lack…
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Keywords:
high power;
temperature;
power applications;
power ... See more keywords
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2
Published in 2022 at "IEEE Transactions on Industrial Electronics"
DOI: 10.1109/tie.2021.3099247
Abstract: Although the gallium nitride (GaN) high-electron-mobility transistor/silicon carbide (SiC) junction field-effect transistor (JFET) cascode device exhibits certain performance advantages over the SiC metal–oxide–semiconductor field-effect transistor (MOSFET), its robustness in harsh operating conditions is unknown. In…
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Keywords:
650 gan;
short circuit;
cascode devices;
cascode ... See more keywords